Scanning Microscopy for Nanotechnology Techniques and Applications /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Zhou, Weilie (Editor), Wang, Zhong Lin (Editor)
• Format: Electronic eBook
• Language: English
• Published: New York, NY : Springer New York, 2007.
• Subjects: Materials science.; Physical measurements.; Measurement.; Optical materials.; Electronic materials.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Optical and Electronic Materials.; Measurement Science and Instrumentation.

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnol...