Scanning Microscopy for Nanotechnology Techniques and Applications /
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnol...
Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
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Άλλοι συγγραφείς: | Zhou, Weilie (Επιμελητής έκδοσης), Wang, Zhong Lin (Επιμελητής έκδοσης) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
New York, NY :
Springer New York,
2007.
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
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