Scanning Microscopy for Nanotechnology Techniques and Applications /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Zhou, Weilie (Επιμελητής έκδοσης), Wang, Zhong Lin (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2007.
• Θέματα: Materials science.; Physical measurements.; Measurement.; Optical materials.; Electronic materials.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Optical and Electronic Materials.; Measurement Science and Instrumentation.

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnol...

Πίνακας περιεχομένων:

• Fundamentals of Scanning Electron Microscopy (SEM)
• Backscattering Detector and EBSD in Nanomaterials Characterization
• X-ray Microanalysis in Nanomaterials
• Low kV Scanning Electron Microscopy
• E-beam Nanolithography Integrated with Scanning Electron Microscope
• Scanning Transmission Electron Microscopy for Nanostructure Characterization
• to In-Situ Nanomanipulation for Nanomaterials Engineering
• Applications of FIB and DualBeam for Nanofabrication
• Nanowires and Carbon Nanotubes
• Photonic Crystals and Devices
• Nanoparticles and Colloidal Self-assembly
• Nano-building Blocks Fabricated through Templates
• One-dimensional Wurtzite Semiconducting Nanostructures
• Bio-inspired Nanomaterials
• Cryo-Temperature Stages in Nanostructural Research.