SpringerLink (Online service), Sachdev, M., & Gyvez, J. P. d. (2007). Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition. Springer US.
Chicago Style (17th ed.) CitationSpringerLink (Online service), Manoj Sachdev, and José Pineda de Gyvez. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition. Boston, MA: Springer US, 2007.
MLA (8th ed.) CitationSpringerLink (Online service), et al. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition. Springer US, 2007.
Warning: These citations may not always be 100% accurate.
