Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition /

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition /

Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptabl...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Άλλοι συγγραφείς:	Sachdev, Manoj (Επιμελητής έκδοσης), Gyvez, José Pineda de (Επιμελητής έκδοσης)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA : Springer US, 2007.
Σειρά:	Frontiers in Electronic Testing, 34
Θέματα:	Engineering. Engineering design. Electrical engineering. Electronics. Microelectronics. Electronic circuits. Circuits and Systems. Electrical Engineering. Engineering Design. Electronics and Microelectronics, Instrumentation.
Διαθέσιμο Online:	Full Text via HEAL-Link

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