Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Sachdev, Manoj (Editor), Gyvez, José Pineda de (Editor)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2007.
• Series: Frontiers in Electronic Testing, 34
• Subjects: Engineering.; Engineering design.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Engineering Design.; Electronics and Microelectronics, Instrumentation.

Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptabl...

Table of Contents:

• Functional and Parametric Defect Models
• Digital CMOS Fault Modeling
• Defects in Logic Circuits and their Test Implications
• Testing Defects and Parametric Variations in RAMs
• Defect-Oriented Analog Testing
• Yield Engineering
• Conclusion.