Design for Manufacturability and Statistical Design A Constructive Approach /
Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of th...
| Main Authors: | , , |
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| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
2008.
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| Subjects: | |
| Online Access: | Full Text via HEAL-Link |
Table of Contents:
- Sources of Variability
- Front End Variability
- Back End Variability
- Environmental Variability
- Variability Characterization and Analysis
- Test Structures For Variability
- Statistical Foundations Of Data Analysis And Modeling
- Design Techniques for Systematic Manufacturability Problems
- Lithography Enhancement Techniques
- Ensuring Interconnect Planarity
- Statistical Circuit Design
- Statistical Circuit Analysis
- Statistical Static Timing Analysis
- Leakage Variability And Joint Parametric Yield
- Parametric Yield Optimization
- Conclusions.