Design for Manufacturability and Statistical Design A Constructive Approach /

Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of th...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Orshansky, Michael (Συγγραφέας), Nassif, Sani R. (Συγγραφέας), Boning, Duane (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Boston, MA : Springer US, 2008.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Sources of Variability
  • Front End Variability
  • Back End Variability
  • Environmental Variability
  • Variability Characterization and Analysis
  • Test Structures For Variability
  • Statistical Foundations Of Data Analysis And Modeling
  • Design Techniques for Systematic Manufacturability Problems
  • Lithography Enhancement Techniques
  • Ensuring Interconnect Planarity
  • Statistical Circuit Design
  • Statistical Circuit Analysis
  • Statistical Static Timing Analysis
  • Leakage Variability And Joint Parametric Yield
  • Parametric Yield Optimization
  • Conclusions.