Design for Manufacturability and Statistical Design A Constructive Approach /

Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of th...

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Bibliographic Details
Main Authors: Orshansky, Michael (Author), Nassif, Sani R. (Author), Boning, Duane (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Boston, MA : Springer US, 2008.
Subjects:
Online Access:Full Text via HEAL-Link
Table of Contents:
  • Sources of Variability
  • Front End Variability
  • Back End Variability
  • Environmental Variability
  • Variability Characterization and Analysis
  • Test Structures For Variability
  • Statistical Foundations Of Data Analysis And Modeling
  • Design Techniques for Systematic Manufacturability Problems
  • Lithography Enhancement Techniques
  • Ensuring Interconnect Planarity
  • Statistical Circuit Design
  • Statistical Circuit Analysis
  • Statistical Static Timing Analysis
  • Leakage Variability And Joint Parametric Yield
  • Parametric Yield Optimization
  • Conclusions.