Aliev, T. (2007). Digital Noise Monitoring of Defect Origin. Springer US.
Chicago Style (17th ed.) CitationAliev, Telman. Digital Noise Monitoring of Defect Origin. Boston, MA: Springer US, 2007.
MLA (8th ed.) CitationAliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2007.
Warning: These citations may not always be 100% accurate.