Digital Noise Monitoring of Defect Origin

• Κύριος συγγραφέας: Aliev, Telman (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2007.
• Θέματα: Engineering.; Applied mathematics.; Engineering mathematics.; Electrical engineering.; Signal, Image and Speech Processing.; Applications of Mathematics.; Communications Engineering, Networks.; Electrical Engineering.

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determin...

Πίνακας περιεχομένων:

• Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features
• Position-Binary Technology of Monitoring Defect at its Origin
• Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin
• Robust Correlation Monitoring of a Defect at its Origin
• Spectral Monitoring of a Defect's Origin
• The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier
• The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.