Evolution of Thin Film Morphology Modeling and Simulations /

• Main Authors: Pelliccione, Matthew (Author), Lu, Toh-Ming (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: New York, NY : Springer New York, 2008.
• Series: Materials Science, 108
• Subjects: Materials science.; Optical materials.; Electronic materials.; Tribology.; Corrosion and anti-corrosives.; Coatings.; Materials > Surfaces.; Thin films.; Materials Science.; Surfaces and Interfaces, Thin Films.; Optical and Electronic Materials.; Tribology, Corrosion and Coatings.

Thin film deposition is the most ubiquitous and critical of the processes used to manufacture high tech devices. Morphology and microstructure of thin films directly controls their optical, magnetic, and electrical properties. This book focuses on modeling and simulations used in research on the mor...