APA (7th ed.) Citation

Tehranipoor, M., & Ahmed, N. (2008). Nanometer Technology Designs High-Quality Delay Tests. Springer US.

Chicago Style (17th ed.) Citation

Tehranipoor, Mohammad, and Nisar Ahmed. Nanometer Technology Designs High-Quality Delay Tests. Boston, MA: Springer US, 2008.

MLA (8th ed.) Citation

Tehranipoor, Mohammad, and Nisar Ahmed. Nanometer Technology Designs High-Quality Delay Tests. Springer US, 2008.

Warning: These citations may not always be 100% accurate.