Nanometer Technology Designs High-Quality Delay Tests

Nanometer Technology Designs High-Quality Delay Tests

While adopting newer, better fabrication technologies provides higher integration and enhances performance, it also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz, timing-related defects have become a high proportion of the total chip...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Tehranipoor, Mohammad (Συγγραφέας), Ahmed, Nisar (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA : Springer US, 2008.
Θέματα:	Engineering. Computer-aided engineering. Electrical engineering. Electronics. Microelectronics. Electronic circuits. Nanotechnology. Circuits and Systems. Electronics and Microelectronics, Instrumentation. Computer-Aided Engineering (CAD, CAE) and Design. Electrical Engineering.
Διαθέσιμο Online:	Full Text via HEAL-Link

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