Transmission Electron Microscopy A Textbook for Materials Science /
This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance...
| Κύριοι συγγραφείς: | , |
|---|---|
| Συγγραφή απο Οργανισμό/Αρχή: | |
| Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
Boston, MA :
Springer US,
2009.
|
| Έκδοση: | 2. |
| Θέματα: | |
| Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Basics
- The Transmission Electron Microscope
- Scattering and Diffraction
- Elastic Scattering
- Inelastic Scattering and Beam Damage
- Electron Sources
- Lenses, Apertures, and Resolution
- How to ‘See’ Electrons
- Pumps and Holders
- The Instrument
- Specimen Preparation
- Diffraction
- Diffraction in TEM
- Thinking in Reciprocal Space
- Diffracted Beams
- Bloch Waves
- Dispersion Surfaces
- Diffraction from Crystals
- Diffraction from Small Volumes
- Obtaining and Indexing Parallel-Beam Diffraction Patterns
- Kikuchi Diffraction
- Obtaining CBED Patterns
- Using Convergent-Beam Techniques
- Imaging
- Amplitude Contrast
- Phase-Contrast Images
- Thickness and Bending Effects
- Planar Defects
- Imaging Strain Fields
- Weak-Beam Dark-Field Microscopy
- High-Resolution TEM
- Other Imaging Techniques
- Image Simulation
- Processing and Quantifying Images
- Spectrometry
- X-ray Spectrometry
- X-ray Spectra and Images
- Qualitative X-ray Analysis and Imaging
- Quantitative X-ray Analysis
- Spatial Resolution and Minimum Detection
- Electron Energy-Loss Spectrometers and Filters
- Low-Loss and No-Loss Spectra and Images
- High Energy-Loss Spectra and Images
- Fine Structure and Finer Details.
