Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzers. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, l...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Echlin, Patrick (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Boston, MA : Springer US, 2009.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
LEADER 03138nam a22004815i 4500
001 978-0-387-85731-2
003 DE-He213
005 20151204173126.0
007 cr nn 008mamaa
008 110414s2009 xxu| s |||| 0|eng d
020 |a 9780387857312  |9 978-0-387-85731-2 
024 7 |a 10.1007/978-0-387-85731-2  |2 doi 
040 |d GrThAP 
050 4 |a TA404.6 
072 7 |a TGMT  |2 bicssc 
072 7 |a TEC021000  |2 bisacsh 
082 0 4 |a 620.11  |2 23 
100 1 |a Echlin, Patrick.  |e author. 
245 1 0 |a Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis  |h [electronic resource] /  |c by Patrick Echlin. 
264 1 |a Boston, MA :  |b Springer US,  |c 2009. 
300 |a XII, 332 p. 159 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Sample Collection and Selection -- Sample Preparation Tools -- Sample Support -- Sample Embedding ?and Mounting -- Sample Exposure -- Sample Dehydration -- Sample Stabilization for Imaging in the SEM -- Sample Stabilization to Preserve Chemical Identity -- Sample Cleaning -- Sample Surface Charge Elimination -- Sample Artifacts and Damage -- Additional Sources of Information. 
520 |a This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzers. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids and gases. While the Handbook complements the best-selling textbook, Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, by Goldstein, et al., it is entirely self-contained and describes what is needed up to the point the sample is put into the instrument. Photomicrographs of each specimen complement the many sample preparation "recipes." Additional chapters describe the general features of specimen preparation in relation to the different needs of scanning electron microscopes and x-ray microanalyzers, and an appendix covers chemicals and equipment applicable to any of the recipes. This practical Handbook is an essential reference for anyone who uses these instruments. It assumes only an elementary knowledge of preparation techniques but also serves as an authoritative guide for more experienced microscopists. 
650 0 |a Materials science. 
650 0 |a Microscopy. 
650 0 |a Condensed matter. 
650 0 |a Biophysics. 
650 0 |a Biological physics. 
650 1 4 |a Materials Science. 
650 2 4 |a Characterization and Evaluation of Materials. 
650 2 4 |a Biological Microscopy. 
650 2 4 |a Condensed Matter Physics. 
650 2 4 |a Biophysics and Biological Physics. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9780387857305 
856 4 0 |u http://dx.doi.org/10.1007/978-0-387-85731-2  |z Full Text via HEAL-Link 
912 |a ZDB-2-CMS 
950 |a Chemistry and Materials Science (Springer-11644)