Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

• Κύριος συγγραφέας: Echlin, Patrick (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2009.
• Θέματα: Materials science.; Microscopy.; Condensed matter.; Biophysics.; Biological physics.; Materials Science.; Characterization and Evaluation of Materials.; Biological Microscopy.; Condensed Matter Physics.; Biophysics and Biological Physics.

This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzers. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, l...

Πίνακας περιεχομένων:

• Sample Collection and Selection
• Sample Preparation Tools
• Sample Support
• Sample Embedding ?and Mounting
• Sample Exposure
• Sample Dehydration
• Sample Stabilization for Imaging in the SEM
• Sample Stabilization to Preserve Chemical Identity
• Sample Cleaning
• Sample Surface Charge Elimination
• Sample Artifacts and Damage
• Additional Sources of Information.