Electron Backscatter Diffraction in Materials Science

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Schwartz, Adam J. (Επιμελητής έκδοσης), Kumar, Mukul (Επιμελητής έκδοσης), Adams, Brent L. (Επιμελητής έκδοσης), Field, David P. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2009.
• Θέματα: Materials science.; Geophysics.; Condensed matter.; Materials Science.; Characterization and Evaluation of Materials.; Materials Science, general.; Condensed Matter Physics.; Geophysics/Geodesy.

 Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale. This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique. 

 Present State of Electron Backscatter Diffraction and Prospective Developments -- Dynamical Simulation of Electron Backscatter Diffraction Patterns -- Representations of Texture -- Energy Filtering in EBSD -- Spherical Kikuchi Maps and Other Rarities -- Application of Electron Backscatter Diffraction to Phase Identification -- Phase Identification Through Symmetry Determination in EBSD Patterns -- Three-Dimensional Orientation Microscopy by Serial Sectioning and EBSD-Based Orientation Mapping in a FIB-SEM -- Collection, Processing, and Analysis of Three-Dimensional EBSD Data Sets -- 3D Reconstruction of Digital Microstructures -- Direct 3D Simulation of Plastic Flow from EBSD Data -- First-Order Microstructure Sensitive Design Based on Volume Fractions and Elementary Bounds -- Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations -- Combinatorial Materials Science and EBSD: A High Throughput Experimentation Tool -- Grain Boundary Networks -- Measurement of the Five-Parameter Grain Boundary Distribution from Planar Sections -- Strain Mapping Using Electron Backscatter Diffraction -- Mapping and Assessing Plastic Deformation Using EBSD -- Analysis of Deformation Structures in FCC Materials Using EBSD and TEM Techniques -- Application of EBSD Methods to Severe Plastic Deformation (SPD) and Related Processing Methods -- Applications of EBSD to Microstructural Control in Friction Stir Welding/Processing -- Characterization of Shear Localization and Shock Damage with EBSD -- Texture Separation for ?/? Titanium Alloys -- A Review of In Situ EBSD Studies -- Electron Backscatter Diffraction in Low Vacuum Conditions -- EBSD in the Earth Sciences: Applications, Common Practice, and Challenges -- Orientation Imaging Microscopy in Research on High Temperature Oxidation.