Electron Backscatter Diffraction in Materials Science

• Corporate Author: SpringerLink (Online service)
• Other Authors: Schwartz, Adam J. (Editor), Kumar, Mukul (Editor), Adams, Brent L. (Editor), Field, David P. (Editor)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2009.
• Subjects: Materials science.; Geophysics.; Condensed matter.; Materials Science.; Characterization and Evaluation of Materials.; Materials Science, general.; Condensed Matter Physics.; Geophysics/Geodesy.

Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routi...