Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002 /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Vilarinho, Paula Maria (Επιμελητής έκδοσης), Rosenwaks, Yossi (Επιμελητής έκδοσης), Kingon, Angus (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Dordrecht : Springer Netherlands, 2005.
• Σειρά: NATO Science Series II: Mathematics, Physics and Chemistry, 186
• Θέματα: Physics.; Condensed matter.; Optical materials.; Electronic materials.; Nanotechnology.; Materials > Surfaces.; Thin films.; Condensed Matter Physics.; Optical and Electronic Materials.; Surfaces and Interfaces, Thin Films.

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in...