Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002 /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Vilarinho, Paula Maria (Editor), Rosenwaks, Yossi (Editor), Kingon, Angus (Editor)
• Format: Electronic eBook
• Language: English
• Published: Dordrecht : Springer Netherlands, 2005.
• Series: NATO Science Series II: Mathematics, Physics and Chemistry, 186
• Subjects: Physics.; Condensed matter.; Optical materials.; Electronic materials.; Nanotechnology.; Materials > Surfaces.; Thin films.; Condensed Matter Physics.; Optical and Electronic Materials.; Surfaces and Interfaces, Thin Films.

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in...