SpringerLink (Online service) & Gusev, E. (2006). Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices. Springer Netherlands.
Chicago Style (17th ed.) CitationSpringerLink (Online service) and Evgeni Gusev. Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices. Dordrecht: Springer Netherlands, 2006.
MLA (8th ed.) CitationSpringerLink (Online service) and Evgeni Gusev. Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices. Springer Netherlands, 2006.
Warning: These citations may not always be 100% accurate.
