Oscillation-Based Test in Mixed-Signal Circuits

Oscillation-Based Test in Mixed-Signal Circuits

Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimen...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Sánchez, Gloria Huertas (Συγγραφέας), García de la Vega, Diego Vázquez (Συγγραφέας), Rueda, Adoración Rueda (Συγγραφέας), Díaz, José Luis Huertas (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Dordrecht : Springer Netherlands, 2006.
Σειρά:Frontiers in Electronic Testing, 36
Θέματα:
Engineering.
Engineering design.
Electrical engineering.
Electronics.
Microelectronics.
Electronic circuits.
Circuits and Systems.
Electrical Engineering.
Engineering Design.
Electronics and Microelectronics, Instrumentation.
Διαθέσιμο Online:Full Text via HEAL-Link
Περιγραφή
Περίληψη:Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
Φυσική περιγραφή:XVI, 452 p. online resource.
ISBN:9781402053153
ISSN:0929-1296 ;

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