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03159nam a22005775i 4500 |
| 001 |
978-1-4020-5646-8 |
| 003 |
DE-He213 |
| 005 |
20151204175506.0 |
| 007 |
cr nn 008mamaa |
| 008 |
100301s2007 ne | s |||| 0|eng d |
| 020 |
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|a 9781402056468
|9 978-1-4020-5646-8
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7 |
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|a 10.1007/978-1-4020-5646-8
|2 doi
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|d GrThAP
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|a TK7888.4
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|a TJFC
|2 bicssc
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|a TEC008010
|2 bisacsh
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|a 621.3815
|2 23
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|a Radiation Effects on Embedded Systems
|h [electronic resource] /
|c edited by RAOUL VELAZCO, PASCAL FOUILLAT, RICARDO REIS.
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| 264 |
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1 |
|a Dordrecht :
|b Springer Netherlands,
|c 2007.
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| 300 |
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|a VIII, 269 p.
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 347 |
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|a text file
|b PDF
|2 rda
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0 |
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|a Radiation Space Environment -- Radiation Effects in Microelectronics -- In-flight Anomalies on Electronic Devices -- Multi-level Fault Effects Evaluation -- Effects of Radiation on Analog and Mixed-Signal Circuits -- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing -- Design Hardening Methodologies for ASICs -- Fault Tolerance in Programmable Circuits -- Automatic Tools for Design Hardening -- Test Facilities for SEE and Dose Testing -- Error Rate Prediction of Digital Architectures: Test Methodology and Tools -- Using the SEEM Software for Laser SET Testing and Analysis.
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| 520 |
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|a Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.
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| 650 |
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0 |
|a Engineering.
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| 650 |
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0 |
|a Nuclear energy.
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| 650 |
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0 |
|a Electrical engineering.
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| 650 |
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0 |
|a Electronics.
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| 650 |
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0 |
|a Microelectronics.
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| 650 |
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0 |
|a Electronic circuits.
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| 650 |
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0 |
|a Nuclear engineering.
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| 650 |
|
0 |
|a Radiation protection.
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| 650 |
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0 |
|a Radiation
|x Safety measures.
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| 650 |
1 |
4 |
|a Engineering.
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| 650 |
2 |
4 |
|a Circuits and Systems.
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| 650 |
2 |
4 |
|a Effects of Radiation/Radiation Protection.
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| 650 |
2 |
4 |
|a Electrical Engineering.
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| 650 |
2 |
4 |
|a Electronics and Microelectronics, Instrumentation.
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| 650 |
2 |
4 |
|a Nuclear Engineering.
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| 650 |
2 |
4 |
|a Nuclear Energy.
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| 700 |
1 |
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|a VELAZCO, RAOUL.
|e editor.
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| 700 |
1 |
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|a FOUILLAT, PASCAL.
|e editor.
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| 700 |
1 |
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|a REIS, RICARDO.
|e editor.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 776 |
0 |
8 |
|i Printed edition:
|z 9781402056451
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| 856 |
4 |
0 |
|u http://dx.doi.org/10.1007/978-1-4020-5646-8
|z Full Text via HEAL-Link
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| 912 |
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|a ZDB-2-ENG
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| 950 |
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|a Engineering (Springer-11647)
|
