Handbook of Microscopy for Nanotechnology

Handbook of Microscopy for Nanotechnology

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Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Yao, Nan (Editor), Wang, Zhong Lin (Editor)
Format: Electronic eBook
Language:English
Published: Boston, MA : Springer US, 2005.
Subjects:
Materials science.
Analytical chemistry.
Condensed matter.
Nanotechnology.
Materials Science.
Characterization and Evaluation of Materials.
Condensed Matter Physics.
Analytical Chemistry.
Online Access:Full Text via HEAL-Link
Table of Contents:
  • Optical Microscopy, Scanning Probe Microscopy, Ion Microscopy and Nanofabrication
  • Confocal Scanning Optical Microscopy and Nanotechnology
  • Scanning Near-Field Optical Microscopy in Nanosciences
  • Scanning Tunneling Microscopy
  • Visualization of Nanostructures with Atomic Force Microscopy
  • Scanning Probe Microscopy for Nanoscale Manipulation and Patterning
  • Scanning Thermal and Thermoelectric Microscopy
  • Imaging Secondary Ion Mass Spectrometry
  • Atom Probe Tomography
  • Focused Ion Beam System—a Multifunctional Tool for Nanotechnology
  • Electron Beam Lithography
  • Electron Microscopy
  • High-Resolution Scanning Electron Microscopy
  • High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
  • Characterization of Nano-Crystalline Materials Using Electron Backscatter Diffraction in the Scanning Electron Microscope
  • High Resolution Transmission Electron Microscopy
  • Scanning Transmission Electron Microscopy
  • In-Situ Electron Microscopy for Nanomeasurements
  • Environmental Transmission Electron Microscopy in Nanotechnology
  • Electron Nanocrystallography
  • Tomography Using the Transmission Electron Microscope
  • Off-Axis Electron Holography
  • SUB-NM Spatially Resolved Electron Energy-Loss Spectroscopy
  • Imaging Magnetic Structures Using TEM.

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