Handbook of Microscopy for Nanotechnology
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can...
| Συγγραφή απο Οργανισμό/Αρχή: | |
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| Άλλοι συγγραφείς: | , |
| Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
Boston, MA :
Springer US,
2005.
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| Θέματα: | |
| Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Optical Microscopy, Scanning Probe Microscopy, Ion Microscopy and Nanofabrication
- Confocal Scanning Optical Microscopy and Nanotechnology
- Scanning Near-Field Optical Microscopy in Nanosciences
- Scanning Tunneling Microscopy
- Visualization of Nanostructures with Atomic Force Microscopy
- Scanning Probe Microscopy for Nanoscale Manipulation and Patterning
- Scanning Thermal and Thermoelectric Microscopy
- Imaging Secondary Ion Mass Spectrometry
- Atom Probe Tomography
- Focused Ion Beam System—a Multifunctional Tool for Nanotechnology
- Electron Beam Lithography
- Electron Microscopy
- High-Resolution Scanning Electron Microscopy
- High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
- Characterization of Nano-Crystalline Materials Using Electron Backscatter Diffraction in the Scanning Electron Microscope
- High Resolution Transmission Electron Microscopy
- Scanning Transmission Electron Microscopy
- In-Situ Electron Microscopy for Nanomeasurements
- Environmental Transmission Electron Microscopy in Nanotechnology
- Electron Nanocrystallography
- Tomography Using the Transmission Electron Microscope
- Off-Axis Electron Holography
- SUB-NM Spatially Resolved Electron Energy-Loss Spectroscopy
- Imaging Magnetic Structures Using TEM.
