Substrate Noise Coupling in RFICs

Substrate Noise Coupling in RFICs addresses substrate noise coupling in RF and mixed signal ICs when used in a system on chip (SoC) containing digital ICs as well. This trend of integrating RF, mixed signal ICs with large digital ICs is found in many of today's commercial ICs such as single chi...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Helmy, Ahmed (Συγγραφέας), Ismail, Mohammed (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Dordrecht : Springer Netherlands, 2008.
Σειρά:Analog Circuits And Signal Processing Series
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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020 |a 9781402081668  |9 978-1-4020-8166-8 
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100 1 |a Helmy, Ahmed.  |e author. 
245 1 0 |a Substrate Noise Coupling in RFICs  |h [electronic resource] /  |c by Ahmed Helmy, Mohammed Ismail. 
264 1 |a Dordrecht :  |b Springer Netherlands,  |c 2008. 
300 |a XV, 119 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
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490 1 |a Analog Circuits And Signal Processing Series 
505 0 |a Analysis of Substrate Noise Coupling -- Experimental Data to Calibrate the Design Flow -- Design Guide for Substrate Noise Isolation in RF Applications -- On Chip Inductors Design Flow -- Case Studies for the Impacts and Remedies of Substrate Noise Coupling -- Conclusion and Future Work. 
520 |a Substrate Noise Coupling in RFICs addresses substrate noise coupling in RF and mixed signal ICs when used in a system on chip (SoC) containing digital ICs as well. This trend of integrating RF, mixed signal ICs with large digital ICs is found in many of today's commercial ICs such as single chip Wi-Fi or Bluetooth solutions and is expected to grow rapidly in the future. The book reports modeling and simulation techniques for substrate noise coupling effects in RFICs and introduces isolation structures and design guides to mitigate such effects with the ultimate goal of enhancing the yield of RF and mixed signal SoCs . This is particularly critical when process feature sizes scale down to the nano meter range. Substrate Noise Coupling in RFICs reports silicon measurements, new test and noise isolation structures as well as calibration of a design flow used in the design and debug phases of RFICs. A design guide is articulated to be used by RFIC designers to maximize signal isolation and optimize chip floor plan, power and ground domains. Industrial examples of RFICs are given as demonstration vehicles to validate the proposed techniques. Some emphasis is put on the design of on-chip spiral inductors and the impact of the substrate on their performance. To our knowledge, this is the first title devoted to the topic of substrate noise coupling in RFICs as part of a large SoC. 
650 0 |a Engineering. 
650 0 |a Electrical engineering. 
650 0 |a Electronic circuits. 
650 1 4 |a Engineering. 
650 2 4 |a Circuits and Systems. 
650 2 4 |a Communications Engineering, Networks. 
700 1 |a Ismail, Mohammed.  |e author. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9781402081651 
830 0 |a Analog Circuits And Signal Processing Series 
856 4 0 |u http://dx.doi.org/10.1007/978-1-4020-8166-8  |z Full Text via HEAL-Link 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647)