CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test /

• Main Authors: Pavlov, Andrei (Author), Sachdev, Manoj (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Dordrecht : Springer Netherlands, 2008.
• Series: Frontiers In Electronic Testing, 40
• Subjects: Engineering.; Computer memory systems.; Electronic circuits.; Circuits and Systems.; Memory Structures.

As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process disturbances and various defect mechanisms contribute to the increasing number of unstable SRAM cells with parametric sensitivity. Growing sizes of SRAM arrays...