Microscopy of Semiconducting Materials 2007

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Cullis, A. G. (Επιμελητής έκδοσης), Midgley, P. A. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Dordrecht : Springer Netherlands, 2008.
• Σειρά: Springer Proceedings in Physics, 120
• Θέματα: Materials science.; Solid state physics.; Physical measurements.; Measurement.; Spectroscopy.; Microscopy.; Electronics.; Microelectronics.; Materials Science.; Materials Science, general.; Solid State Physics.; Spectroscopy and Microscopy.; Measurement Science and Instrumentation.; Electronics and Microelectronics, Instrumentation.

The fifteenth international conference on Microscopy of Semiconducting Materials took place in Cambridge, UK on 2-5 April 2007. It was organised by the Institute of Physics, with co-sponsorship by the Royal Microscopical Society and endorsement by the Materials Research Society. The conference focus...

Πίνακας περιεχομένων:

• Wide Band-Gap Nitrides
• General Heteroepitaxial Layers
• High Resolution Microscopy and Nanoanalysis
• Self-Organised and Quantum Domain Structures
• Processed Silicon and Other Device Materials
• Device and Doping Studies
• FIB, SEM and SPM Advances.