Microscopy of Semiconducting Materials 2007
The fifteenth international conference on Microscopy of Semiconducting Materials took place in Cambridge, UK on 2-5 April 2007. It was organised by the Institute of Physics, with co-sponsorship by the Royal Microscopical Society and endorsement by the Materials Research Society. The conference focus...
Συγγραφή απο Οργανισμό/Αρχή: | |
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Άλλοι συγγραφείς: | , |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Dordrecht :
Springer Netherlands,
2008.
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Σειρά: | Springer Proceedings in Physics,
120 |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Wide Band-Gap Nitrides
- General Heteroepitaxial Layers
- High Resolution Microscopy and Nanoanalysis
- Self-Organised and Quantum Domain Structures
- Processed Silicon and Other Device Materials
- Device and Doping Studies
- FIB, SEM and SPM Advances.