Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations /
This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, co...
Κύριοι συγγραφείς: | Garg, Rajesh (Συγγραφέας), Khatri, Sunil P. (Συγγραφέας) |
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Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Boston, MA :
Springer US,
2010.
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
-
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations
ανά: Garg, Rajesh
Έκδοση: (2010) -
Minimizing and Exploiting Leakage in VLSI Design
ανά: Jayakumar, Nikhil, κ.ά.
Έκδοση: (2010) -
On and Off-Chip Crosstalk Avoidance in VLSI Design
ανά: Duan, Chunjie, κ.ά.
Έκδοση: (2010) -
Principles of VLSI RTL Design A Practical Guide /
ανά: Churiwala, Sanjay, κ.ά.
Έκδοση: (2011) -
Process Variations and Probabilistic Integrated Circuit Design
Έκδοση: (2012)