APA (7th ed.) Citation

Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., & Virazel, A. (2010). Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (1.). Springer US.

Chicago Style (17th ed.) Citation

Bosio, Alberto, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, and Arnaud Virazel. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Boston, MA: Springer US, 2010.

MLA (8th ed.) Citation

Bosio, Alberto, et al. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Springer US, 2010.