Παραπομπή σε μορφή APA (7η εκδ.)

Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., & Virazel, A. (2010). Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (1.). Springer US.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Bosio, Alberto, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, και Arnaud Virazel. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Boston, MA: Springer US, 2010.

Παραπομπή σε μορφή MLA (8th εκδ.)

Bosio, Alberto, et al. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Springer US, 2010.