Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies /

Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies /

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and d...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Bosio, Alberto (Συγγραφέας), Dilillo, Luigi (Συγγραφέας), Girard, Patrick (Συγγραφέας), Pravossoudovitch, Serge (Συγγραφέας), Virazel, Arnaud (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA : Springer US, 2010.
Έκδοση:	1.
Θέματα:	Engineering. Computer-aided engineering. Electronic circuits. Circuits and Systems. Computer-Aided Engineering (CAD, CAE) and Design.
Διαθέσιμο Online:	Full Text via HEAL-Link

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