Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies /

• Κύριοι συγγραφείς: Bosio, Alberto (Συγγραφέας), Dilillo, Luigi (Συγγραφέας), Girard, Patrick (Συγγραφέας), Pravossoudovitch, Serge (Συγγραφέας), Virazel, Arnaud (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2010.
• Έκδοση: 1.
• Θέματα: Engineering.; Computer-aided engineering.; Electronic circuits.; Circuits and Systems.; Computer-Aided Engineering (CAD, CAE) and Design.

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and d...

Πίνακας περιεχομένων:

• Basics on SRAM Testing
• Resistive-Open Defects in Core-Cells
• Resistive-Open Defects in Pre-charge Circuits
• Resistive-Open Defects in Address Decoders
• Resistive-Open Defects in Write Drivers
• Resistive-Open Defects in Sense Amplifiers
• Faults Due to Process Variations in SRAMs
• Diagnosis and Design-for-Diagnosis.