Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies /

• Main Authors: Bosio, Alberto (Author), Dilillo, Luigi (Author), Girard, Patrick (Author), Pravossoudovitch, Serge (Author), Virazel, Arnaud (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2010.
• Edition: 1.
• Subjects: Engineering.; Computer-aided engineering.; Electronic circuits.; Circuits and Systems.; Computer-Aided Engineering (CAD, CAE) and Design.

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and d...

Table of Contents:

• Basics on SRAM Testing
• Resistive-Open Defects in Core-Cells
• Resistive-Open Defects in Pre-charge Circuits
• Resistive-Open Defects in Address Decoders
• Resistive-Open Defects in Write Drivers
• Resistive-Open Defects in Sense Amplifiers
• Faults Due to Process Variations in SRAMs
• Diagnosis and Design-for-Diagnosis.