Fundamentals of III-V Semiconductor MOSFETs

Fundamentals of III-V Semiconductor MOSFETs presents the fundamentals and current status of research of compound semiconductor metal-oxide-semiconductor field-effect transistors (MOSFETs) that are envisioned as a future replacement of silicon in digital circuits. The material covered begins with a r...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Oktyabrsky, Serge (Επιμελητής έκδοσης), Ye, Peide (Επιμελητής έκδοσης)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Boston, MA : Springer US : Imprint: Springer, 2010.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Non-Silicon MOSFET Technology: A Long Time Coming
  • Properties and Trade-Offs of Compound Semiconductor MOSFETs
  • Device Physics and Performance Potential of III-V Field-Effect Transistors
  • Theory of HfO2-Based High-k Dielectric Gate Stacks
  • Density Functional Theory Simulations of High-k Oxides on III-V Semiconductors
  • Interfacial Chemistry of Oxides on III-V Compound Semiconductors
  • Atomic-Layer Deposited High-k/III-V Metal-Oxide-Semiconductor Devices and Correlated Empirical Model
  • Materials and Technologies for III-V MOSFETs
  • InGaAs, Ge, and GaN Metal-Oxide-Semiconductor Devices with High-k Dielectrics for Science and Technology Beyond Si CMOS
  • Sub-100 nm Gate III-V MOSFET for Digital Applications
  • Electrical and Material Characteristics of Hafnium Oxide with Silicon Interface Passivation on III-V Substrate for Future Scaled CMOS Technology
  • p-type Channel Field-Effect Transistors
  • Insulated Gate Nitride-Based Field Effect Transistors
  • Technology/Circuit Co-Design for III-V FETs.