APA (7th ed.) Citation

Liu, J., Salmela, O., Sarkka, J., Morris, J. E., Tegehall, P., & Andersson, C. (2011). Reliability of Microtechnology: Interconnects, Devices and Systems (1.). Springer New York.

Chicago Style (17th ed.) Citation

Liu, Johan, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, and Cristina Andersson. Reliability of Microtechnology: Interconnects, Devices and Systems. 1. New York, NY: Springer New York, 2011.

MLA (8th ed.) Citation

Liu, Johan, et al. Reliability of Microtechnology: Interconnects, Devices and Systems. 1. Springer New York, 2011.