Reliability of Microtechnology Interconnects, Devices and Systems /

• Κύριοι συγγραφείς: Liu, Johan (Συγγραφέας), Salmela, Olli (Συγγραφέας), Sarkka, Jussi (Συγγραφέας), Morris, James E. (Συγγραφέας), Tegehall, Per-Erik (Συγγραφέας), Andersson, Cristina (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2011.
• Έκδοση: 1.
• Θέματα: Engineering.; Nanotechnology.; Quality control.; Reliability.; Industrial safety.; Electronics.; Microelectronics.; Optical materials.; Electronic materials.; Electronics and Microelectronics, Instrumentation.; Optical and Electronic Materials.; Quality Control, Reliability, Safety and Risk.; Nanotechnology and Microengineering.

Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general fail...

Πίνακας περιεχομένων:

• Introduction to Reliability and its Importance
• Reliability Metrology
• General Failure Mechanisms of Microsystems
• Solder and Conductive Adhesive Joint Reliability
• Accelerated Testing
• Reliability Design for Manufacturability
• Component Reliability
• System Level Reliability
• Reliability and Quality Management of Microsystem
• Experimental Tools for Reliability Analysis.