Reliability of Microtechnology Interconnects, Devices and Systems /

Reliability of Microtechnology Interconnects, Devices and Systems /

Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general fail...

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Bibliographic Details
Main Authors: Liu, Johan (Author), Salmela, Olli (Author), Sarkka, Jussi (Author), Morris, James E. (Author), Tegehall, Per-Erik (Author), Andersson, Cristina (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer New York, 2011.
Edition:1.
Subjects:
Engineering.
Nanotechnology.
Quality control.
Reliability.
Industrial safety.
Electronics.
Microelectronics.
Optical materials.
Electronic materials.
Electronics and Microelectronics, Instrumentation.
Optical and Electronic Materials.
Quality Control, Reliability, Safety and Risk.
Nanotechnology and Microengineering.
Online Access:Full Text via HEAL-Link

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ΒΚΠ - Πατρα: ALFd

Holdings details from ΒΚΠ - Πατρα: ALFd
Call Number: 330.01 BAU
Copy 1 Available

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 330.01 BAU
Copy 2 Available
Copy 3 Available

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