MEMS Reliability

• Κύριοι συγγραφείς: Hartzell, Allyson L. (Συγγραφέας), da Silva, Mark G. (Συγγραφέας), Shea, Herbert R. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US : Imprint: Springer, 2011.
• Σειρά: MEMS Reference Shelf,
• Θέματα: Engineering.; Electronics.; Microelectronics.; Electronics and Microelectronics, Instrumentation.

Successfully bringing MEMS-based products to market hinges on engineering the component to have sufficient reliability for the intended application, yet the reliability and qualification methodology for MEMS based products is not widely understood. Companies that have a deep understanding of MEMS re...