Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures /
Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...
Κύριοι συγγραφείς: | Stanisavljević, Miloš (Συγγραφέας), Schmid, Alexandre (Συγγραφέας), Leblebici, Yusuf (Συγγραφέας) |
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Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
New York, NY :
Springer New York,
2011.
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
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