Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures /

• Κύριοι συγγραφείς: Stanisavljević, Miloš (Συγγραφέας), Schmid, Alexandre (Συγγραφέας), Leblebici, Yusuf (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2011.
• Θέματα: Engineering.; Computer-aided engineering.; Quality control.; Reliability.; Industrial safety.; Electronic circuits.; Circuits and Systems.; Quality Control, Reliability, Safety and Risk.; Computer-Aided Engineering (CAD, CAE) and Design.

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

Πίνακας περιεχομένων:

• Introduction
• Reliability, Faults and Fault Models
• Nanotechnology and Nanodevices
• Fault-Tolerant Architectures and Approaches
• Reliability Evaluation Techniques
• Averaging Design Implementations
• Statistical Evaluation of Fault-Tolerance Using Proability Density Functions
• System Level Reliability Evaluation and Optimization
• Summary and Conclusions
• References.