Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures /

Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures /

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

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Bibliographic Details
Main Authors: Stanisavljević, Miloš (Author), Schmid, Alexandre (Author), Leblebici, Yusuf (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer New York, 2011.
Subjects:
Engineering.
Computer-aided engineering.
Quality control.
Reliability.
Industrial safety.
Electronic circuits.
Circuits and Systems.
Quality Control, Reliability, Safety and Risk.
Computer-Aided Engineering (CAD, CAE) and Design.
Online Access:Full Text via HEAL-Link

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ΒΚΠ - Πατρα: ALFd

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Call Number: 330.01 BAU
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ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 330.01 BAU
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