Reliability Physics and Engineering Time-To-Failure Modeling /

• Κύριος συγγραφέας: McPherson, J.W (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US : Imprint: Springer, 2010.
• Θέματα: Engineering.; Mechanical engineering.; Quality control.; Reliability.; Industrial safety.; Electronics.; Microelectronics.; Quality Control, Reliability, Safety and Risk.; Electronics and Microelectronics, Instrumentation.; Mechanical Engineering.

Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products. Key features include: • Materials/Device Degradation • Degradation Kinetics • Time-To-Failure Modeling • Statistical Tools • Failure-Rate Modeling...

Πίνακας περιεχομένων:

• Materials and Device Degradation
• From Material/Device Degradation to Time-To-Failure
• Time-To-Failure Modeling
• Gaussian Statistics — An Overview
• Time-To-Failure Statistics
• Failure Rate Modeling
• Accelerated Degradation
• Acceleration Factor Modeling
• Ramp-to-Failure Testing
• Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits
• Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering
• Conversion of Dynamical Stresses into Effective Static Values
• Increasing the Reliability of Device/Product Designs
• Erratum to: Materials and Device Degradation.