Advanced Computing in Electron Microscopy

• Κύριος συγγραφέας: Kirkland, Earl J. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2010.
• Θέματα: Physics.; Numerical analysis.; Spectroscopy.; Microscopy.; Electrical engineering.; Materials science.; Spectroscopy and Microscopy.; Electrical Engineering.; Characterization and Evaluation of Materials.; Numeric Computing.

Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. T...

Πίνακας περιεχομένων:

• The Transmission Electron Microscope
• Linear Image Approximations
• Sampling and the Fast Fourier Transform
• Calculation of Images of Thin Specimens
• Theory of Calculation of Images of Thick Specimens
• Multislice Applications and Examples
• The Programs
• Plotting Transfer Functions
• The Fourier Projection Theorem
• Atomic Potentials and Scattering Factors
• Bilinear Interpolation
• 3D Perspective View.