Extreme Statistics in Nanoscale Memory Design

• Corporate Author: SpringerLink (Online service)
• Other Authors: Singhee, Amith (Editor), Rutenbar, Rob A. (Editor)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US : Imprint: Springer, 2010.
• Edition: 1.
• Series: Integrated Circuits and Systems,
• Subjects: Engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.

Extreme Statistics in Nanoscale Memory Design brings together some of the world’s leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme stat...