Extreme Statistics in Nanoscale Memory Design

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Singhee, Amith (Επιμελητής έκδοσης), Rutenbar, Rob A. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US : Imprint: Springer, 2010.
• Έκδοση: 1.
• Σειρά: Integrated Circuits and Systems,
• Θέματα: Engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.

Extreme Statistics in Nanoscale Memory Design brings together some of the world’s leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme stat...

Πίνακας περιεχομένων:

• Extreme Statistics in Memories
• Statistical Nano CMOS Variability and Its Impact on SRAM
• Importance Sampling-Based Estimation: Applications to Memory Design
• Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics
• Yield Estimation by Computing Probabilistic Hypervolumes
• Most Probable Point-Based Methods
• Extreme Value Theory: Application to Memory Statistics.