Kanekawa, N., Ibe, E. H., Suga, T., & Uematsu, Y. (2011). Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances. Springer New York : Imprint: Springer.
Chicago Style (17th ed.) CitationKanekawa, Nobuyasu, Eishi H. Ibe, Takashi Suga, and Yutaka Uematsu. Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances. New York, NY: Springer New York : Imprint: Springer, 2011.
MLA (8th ed.) CitationKanekawa, Nobuyasu, et al. Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances. Springer New York : Imprint: Springer, 2011.
Warning: These citations may not always be 100% accurate.