Kanekawa, N., Ibe, E. H., Suga, T., & Uematsu, Y. (2011). Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances. Springer New York : Imprint: Springer.
Παραπομπή σε μορφή Chicago (17η εκδ.)Kanekawa, Nobuyasu, Eishi H. Ibe, Takashi Suga, και Yutaka Uematsu. Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances. New York, NY: Springer New York : Imprint: Springer, 2011.
Παραπομπή σε μορφή MLA (8th εκδ.)Kanekawa, Nobuyasu, et al. Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances. Springer New York : Imprint: Springer, 2011.
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