Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Nicolaidis, Michael (Επιμελητής έκδοσης)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Boston, MA : Springer US : Imprint: Springer, 2011.
Σειρά:Frontiers in Electronic Testing, 41
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Soft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends
  • Radiation Induced Single-Event Effects: Physical Mechanisms and Classification
  • JEDEC Standard on Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors
  • Cell-Level Modelling and Simulation
  • Circuit and System Level Modelling and Simulation
  • Hardware Fault Injection
  • Accelerated Radiation Testing for Space Applications
  • Testing for Ground-Level Applications
  • Soft Error Mitigation Techniques
  • Convergence of Mitigation Techniques for Soft Errors and Other Reliability Issues and Power Aware Mitigation Techniques
  • Software Level Soft-Error Mitigation Techniques
  • System Level Soft-Error Mitigation Techniques.