Scanning Transmission Electron Microscopy Imaging and Analysis /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Pennycook, Stephen J. (Επιμελητής έκδοσης), Nellist, Peter D. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York : Imprint: Springer, 2011.
• Θέματα: Materials science.; Microscopy.; Condensed matter.; Solid state physics.; Optical materials.; Electronic materials.; Nanotechnology.; Materials Science.; Optical and Electronic Materials.; Characterization and Evaluation of Materials.; Biological Microscopy.; Solid State Physics.; Condensed Matter Physics.

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analys...

Πίνακας περιεχομένων:

• Electron Optics and Aberration Correction
• Fundamentals of Scattering Theory
• Image formation in STEM
• Electron energy loss spectroscopy
• Energy dispersive x-ray analysis
• STEM of complex oxides
• STEM of complex alloys
• STEM of catalysts
• STEM of semiconductor devices
• STEM of ceramic materials
• STEM of quasicrystals
• STEM of nanomaterials
• 3D STEM: tomography
• 3D STEM: depth slicing
• Nanobeam diffraction.