Nanoscale Memory Repair

• Main Authors: Horiguchi, Masashi (Author), Itoh, Kiyoo (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: New York, NY : Springer New York : Imprint: Springer, 2011.
• Series: Integrated Circuits and Systems,
• Subjects: Engineering.; Computer-aided engineering.; Electronic circuits.; Circuits and Systems.; Computer-Aided Engineering (CAD, CAE) and Design.

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. As a result, repair techniques have been indispensable for nano-scale memories. Without these techniques, even modern MPUs/...