High Quality Test Pattern Generation and Boolean Satisfiability

High Quality Test Pattern Generation and Boolean Satisfiability

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay t...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Eggersglüß, Stephan (Συγγραφέας), Drechsler, Rolf (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA : Springer US, 2012.
Θέματα:	Engineering. Microprocessors. Electronics. Microelectronics. Electronic circuits. Circuits and Systems. Electronics and Microelectronics, Instrumentation. Processor Architectures.
Διαθέσιμο Online:	Full Text via HEAL-Link

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Debugging Systems-on-Chip Communication-centric and Abstraction-based Techniques /
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Source-Synchronous Networks-On-Chip Circuit and Architectural Interconnect Modeling /
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Embedded Systems Design with Special Arithmetic and Number Systems
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