High Quality Test Pattern Generation and Boolean Satisfiability

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay t...

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Bibliographic Details
Main Authors: Eggersglüß, Stephan (Author), Drechsler, Rolf (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Boston, MA : Springer US, 2012.
Subjects:
Online Access:Full Text via HEAL-Link
Table of Contents:
  • Part I: Preliminaries and Previous Work
  • Circuits and Testing
  • Boolean Satisfiability
  • ATPG Based on Boolean Satisfiability
  • Part II: New SAT Techniques and their Application in ATPG
  • Dynamic Clause Activation
  • Circuit-based Dynamic Learning
  • Part III: High Quality Delay Test Generation
  • High Quality ATPG for Transition Faults
  • Path Delay Fault Model
  • Summary and Outlook.