High Quality Test Pattern Generation and Boolean Satisfiability

• Κύριοι συγγραφείς: Eggersglüß, Stephan (Συγγραφέας), Drechsler, Rolf (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2012.
• Θέματα: Engineering.; Microprocessors.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.; Processor Architectures.

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay t...

Πίνακας περιεχομένων:

• Part I: Preliminaries and Previous Work
• Circuits and Testing
• Boolean Satisfiability
• ATPG Based on Boolean Satisfiability
• Part II: New SAT Techniques and their Application in ATPG
• Dynamic Clause Activation
• Circuit-based Dynamic Learning
• Part III: High Quality Delay Test Generation
• High Quality ATPG for Transition Faults
• Path Delay Fault Model
• Summary and Outlook.