Life-Cycle Assessment of Semiconductors
Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information te...
| Κύριος συγγραφέας: | Boyd, Sarah B. (Συγγραφέας) |
|---|---|
| Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
| Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
New York, NY :
Springer New York : Imprint: Springer,
2012.
|
| Θέματα: | |
| Διαθέσιμο Online: | Full Text via HEAL-Link |
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